Edit my courses

Dr. Ginger Yu is teaching the following

ECE 302 Microelectronics   View Course's Online SyllabusThis course has an associated lab section
         
Introduction to the physics of semiconductors, PN Junctions, BJT and MOS field Effect Transistors: Physics of operation, IV characteristics, circuit models, SPICE analysis; simple diode circuits; Single Stage Transistor Amplifiers: Common Emitter and Common Source configurations, biasing, calculations of small signal voltage gain, current gain, input resistance and output resistance; Introduction to Differential Amplifiers, Operational Amplifiers.

Additional course information provided by the department:

Introduction to the physics of semiconductors, diode (pn-junctions, and transistors (MOSFET, BJT): Physics of operation, I-V characteristics, circuit models, SPICE analysis; diode circuits; Single Stage Transistor Amplifiers: Common Emitter and Common Source configurations, biasing, calculation of small signal voltage gain, current gain, input resistance and output resistance; Logic Inverters.
 
Pre-Requisites: A grade of C- or better in ECE 211
Co-Requisites:None
Restrictions:None
Credits: 4

Summer I '12 Instructors: Yu G
Spring '12 Instructors: Bozkurt A, Lunardi L

 
 
ECE 331 Principles of Electrical Engineering I   View Course's WolfWare HomepageView Course's Online Syllabus
         
Concepts, units and methods of analysis in electrical engineering. Analysis of d-c and a-c circuits, characteristics of linear and non-linear electrical devices, transformers, motors and control systems. Not available to EE and CPE majors.
 
Pre-Requisites: MA 241, PY 208
Co-Requisites:None
Restrictions:Department Consent Required
Credits: 3

Spring '12 Instructors: Nicolescu E, Molnar K

 
 
ECE 739 Integrated Circuits Technology and Fabrication Laboratory   This course has an associated lab section
         
An integrated circuit laboratory to serve as a companion to ECE 538. Hands-on experience in semiconductor fabrication laboratory. Topics include: techniques used to fabricate and electrically test discrete semiconductor devices, the effects of process variations on measurable parameters.
 
Pre-Requisites: ECE 538
Co-Requisites:None
Restrictions:Department Consent Required
Credits: 3

Spring '12 Instructors: Yu G