Interdisciplinary Distinguished Lecturer: Charles A. Bouman

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Grand Challenge Problems in Digital Imaging

Charles A. Bouman, Michael J. and Katherine R. Birck Professor of Electrical and Computer Engineering
Purdue University

Charles A. Bouman spoke on Friday, March 5th, 2010 at 1:00PM in Engineering Building II, Room 1230

Over the last 30 years, imaging technologies have truly revolutionized many important aspects of our lives. Television and the web have made images pervasive, but in addition the innovations of medical imaging have changed the face of healthcare. In fact, in a recent study of the National Academy of Engineering, "Imaging" was named as one of the 20 greatest engineering achievements of the 20th century. With all this success, it is tempting to think that we are finished, but this talk makes the point that there is still a long way to go by posing a set of 6 fundamentally unsolved Grand Challenge problems in the field of imaging. Each problem is presented along with research examples from a variety of researchers that illustrate the importance of the problems, the possible strategies for success, and the potential benefits to society.

Charles A. Bouman (F) received a B.S.E.E. degree from the University of Pennsylvania in 1981 and a MS degree from the University of California at Berkeley in 1982. From 1982 to 1985, he was a full staff member at MIT Lincoln Laboratory and in 1989, he received a Ph.D. in electrical engineering from Princeton University. He joined the faculty of Purdue University in 1989, where he is currently the Michael J. and Katherine R. Birck Professor of Electrical and Computer Engineering. Prof. Bouman's research focuses on the use of statistical image models, multiscale techniques, and fast algorithms in applications including tomographic reconstruction, medical imaging, and document rendering and acquisition. Prof. Bouman is a Fellow of the IEEE, the American Institute for Medical and Biological Engineering (AIMBE), the Society for Imaging Science and Technology (IS&T), and the SPIE Professional Society.